High-speed gating circuit using the E8OT beam deflection tube

This paper describes a high-speed gate circuit for an information sampling system employing the E8OT beam deflection tube. The time required to open this gate fully is less than 7 milli-microseconds. This gate is superior to conventional multigrid gates in that the circuits are less complex, more reliable and have only minimal signal feed-through. Furthermore, a preliminary stage of pulse stretching is available without additional circuit elements.