Title :
Effects of fluctuations on Current-Voltage characteristics of Josephson tunnel junctions
Author :
Barone, A. ; Camerlingo, C. ; Cristiano, R. ; Ovchinnikov, Yu N.
Author_Institution :
Istituto di Cibernetica del Consiglio Nazionale delle Ricerche, Arco Felice, Italy
fDate :
3/1/1985 12:00:00 AM
Abstract :
Effects of finite capacitance on the Current-Voltage (I-V) characteristics of a Josephson tunnel junction in presence of both thermal and quantum noise have been investigated. The analysis allows the determination of significant features of the I-V curves in different situations.
Keywords :
Josephson devices; Current-voltage characteristics; Equations; Fluctuations; Integrated circuit noise; Low voltage; Potential well; Quantum capacitance; Tail; Temperature; Tunneling;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1985.1063874
