DocumentCode
1010908
Title
Effects of fluctuations on Current-Voltage characteristics of Josephson tunnel junctions
Author
Barone, A. ; Camerlingo, C. ; Cristiano, R. ; Ovchinnikov, Yu N.
Author_Institution
Istituto di Cibernetica del Consiglio Nazionale delle Ricerche, Arco Felice, Italy
Volume
21
Issue
2
fYear
1985
fDate
3/1/1985 12:00:00 AM
Firstpage
626
Lastpage
628
Abstract
Effects of finite capacitance on the Current-Voltage (I-V) characteristics of a Josephson tunnel junction in presence of both thermal and quantum noise have been investigated. The analysis allows the determination of significant features of the I-V curves in different situations.
Keywords
Josephson devices; Current-voltage characteristics; Equations; Fluctuations; Integrated circuit noise; Low voltage; Potential well; Quantum capacitance; Tail; Temperature; Tunneling;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1985.1063874
Filename
1063874
Link To Document