DocumentCode
1011072
Title
Ellipsoidal method for design centering and yield estimation
Author
Wojciechowski, Jacek M. ; Vlach, Jiri
Author_Institution
Warsaw Univ. of Poland, Poland
Volume
12
Issue
10
fYear
1993
fDate
10/1/1993 12:00:00 AM
Firstpage
1570
Lastpage
1579
Abstract
A method for constraint region approximation, design centering and yield estimation is introduced. Extreme points of the constraint region are identified by inscribing into it the largest possible ellipsoid. Ellipsoid center is the point that centers the design. Ellipsoidal, polytope and second order Taylor series approximation schemes to the constraint region are discussed. Accuracy and implementation of the method are outlined. Two examples testing the method are included and applications to centering, tolerancing and yield estimation are shown
Keywords
constraint theory; network parameters; network synthesis; series (mathematics); constraint region approximation; design centering; ellipsoidal approximation; polytope approximation; second order Taylor series approximation; tolerancing; yield estimation; Circuit simulation; Circuit testing; Costs; Design methodology; Design optimization; Ellipsoids; Optimization methods; Performance analysis; Statistical distributions; Yield estimation;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.256932
Filename
256932
Link To Document