Applications of one-dimensional cellular automata and linear feedback shift registers for pseudo-exhaustive testing

Author

Damarla, Thyagaraju ; Sathaye, Avinash

Author_Institution

Kentucky Univ., Lexington, KY, USA

Volume

12

Issue

10

fYear

1993

fDate

10/1/1993 12:00:00 AM

Firstpage

1580

Lastpage

1591

Abstract

Recent studies have shown that cellular automata (CA) can be used in place of linear feedback shift registers (LFSRs). Due to their regular structure and local feedback connections, VLSI layout of CA is easy and results in saving silicon area. Some properties of CAs derived using Rules 90 and 150 in terms of characteristic polynomials are presented. In particular, (a) computation of characteristic polynomials in CA, (b) computation of sequence lengths generated by various CA/LFSRs, and (c) pseudo-exhaustive testing by sequences generated by CA/LFSRs are accomplished

Keywords

VLSI; cellular automata; integrated circuit testing; logic testing; shift registers; VLSI layout; characteristic polynomials; linear feedback shift registers; one-dimensional cellular automata; pseudo-exhaustive testing; sequence lengths; sequences; Automatic testing; Built-in self-test; Character generation; Linear feedback shift registers; Logic testing; Polynomials; Silicon; State-space methods; System testing; Test pattern generators;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.256933

Filename

256933