• DocumentCode
    1011290
  • Title

    Application of a Logarithmic Complementary Metal–Oxide–Semiconductor Camera in White-Light Interferometry

  • Author

    Egan, Patrick ; Lakestani, Fereydoun ; Whelan, Maurice P. ; Connelly, Michael J.

  • Author_Institution
    Univ. of Limerick, Limerick
  • Volume
    57
  • Issue
    1
  • fYear
    2008
  • Firstpage
    134
  • Lastpage
    139
  • Abstract
    This paper describes the characterization, modeling, and application of a direct-readout complementary metal-oxide-semiconductor (CMOS) camera in white-light interferometry (WLI). The camera that was used consisted of a direct-readout 1024times1024 pixel logarithmic CMOS sensor. A continuous analog voltage from each pixel was converted to an 8-bit value by an internal analog-to-digital converter and processed with a digital signal processor. A mathematical model relating the input light intensity to the 8-bit digitized output is developed, which is critical in applications where knowledge of the scene intensity is essential to estimating the maximum allowable frame rates. The camera was utilized in WLI, and its application is analyzed in terms of maximum output signal amplitude, imaging speed, and light intensity. The mathematical modeling is implemented with SPICE simulations and verified with experimental data.
  • Keywords
    CMOS image sensors; SPICE; analogue-digital conversion; digital signal processing chips; light interferometry; readout electronics; 8-bit digitized output; SPICE simulations; complementary metal-oxide-semiconductor camera; continuous analog voltage; digital signal processor; direct-readout CMOS camera; imaging speed; internal analog-to-digital converter; logarithmic CMOS sensor; maximum output signal amplitude; picture size 1024 pixel; white-light interferometry; Analog-digital conversion; CMOS image sensors; Cameras; Digital signal processors; Layout; Mathematical model; Optical interferometry; Semiconductor device modeling; Sensor phenomena and characterization; Voltage; Calibration; cameras; complementary metal–oxide–semiconductor field effect transistors (CMOSFETs); machine vision; modeling; optical interferometry;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.907962
  • Filename
    4404125