Title :
Outdiffused junction diode
Author :
Rediker, R.H. ; Halpern, Joel
Author_Institution :
Massachusetts Institute of Technology, Lexington, MA, USA
fDate :
4/1/1957 12:00:00 AM
Keywords :
Alloying; Aluminum; Birefringence; Capacitance; Computer applications; Diodes; Forward contracts; Germanium; Helium; Impurities; Laboratories; Leak detection; Oscillators; Silicon; Skin; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1957.14244