DocumentCode
1011446
Title
Via holes for GaAs MMICs fabricated using reactive ion etching
Author
Hilton, K.P. ; Woodward, J.
Author_Institution
Royal Signals & Radar Establishment, Malvern, UK
Volume
21
Issue
21
fYear
1985
Firstpage
962
Lastpage
963
Abstract
A dry etching process has been employed in the successful fabrication of through-substrate via holes for GaAs MMICs. The etching was carried out using Freon 12 (CCl2F2) as the etching gas. These vias have been shown to have low loss up to 12GHz.
Keywords
III-V semiconductors; gallium arsenide; integrated circuit technology; microwave integrated circuits; monolithic integrated circuits; sputter etching; Freon 12; GaAs MMICs; dichlorodifluoromethane; dry etching; etching gas; reactive ion etching; via holes;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19850679
Filename
4251488
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