FeCr sputter-deposited films with perpendicular anisotropy

The origin of the perpendicular anisotropy in sputter-deposited Fe1-xCrx(X=0.3-0.4) films was investigated by measuring the temperature dependences of saturation magnetization (Ms) and perpendicular anisotropy (Ku) and by SEM observation of the chemically etched surface of these films. Msand Kuof the films did not show meaningful temperature dependences between -150 and 100°C. SEM photographs as well as X-ray diffraction patterns showed the existences of Cr-rich and Fe-rich phases. Cr-rich bcc phase which is nonmagnetic grows up perpendicularly and segregates the ferromagnetic phases. Shape anisotropy seems to play an important part of the perpendicular anisotropy in FeCr films, which is consistent with the temperature dependences of Msand Ku.