Title :
Ultrashort electrical pulses open a new gateway into biological cells
Author :
Schoenbach, Karl H. ; Joshi, Ravindra P. ; Kolb, Juergen F. ; Chen, Nianyong ; Stacey, Michael ; Blackmore, Peter F. ; Buescher, E. Stephen ; Beebe, Stephen J.
Author_Institution :
Center for Bioelectrics, Old Dominion Univ., Norfolk, VA, USA
fDate :
7/1/2004 12:00:00 AM
Abstract :
An electrical model for biological cells predicts that for pulses with durations shorter than the charging time of the outer membrane, there is an increasing probability of electric field interactions with intracellular structures. Experimental studies in which human cells were exposed to pulsed electric fields of up to 300-kV/cm amplitude, with durations as short as 10 ns, have confirmed this hypothesis. The observed effects include the breaching of intracellular granule membranes without permanent damage to the cell membrane, abrupt rises in intracellular free calcium levels, and enhanced expression of genes. At increased electric fields, the application of submicrosecond pulses induces apoptosis (programmed cell death) in biological cells, an effect that has been shown to reduce the growth of tumors. Possible applications of the intracellular electroeffect are enhancing gene delivery to the nucleus, controlling cell functions that depend on calcium release (causing cell immobilization), and treating tumors.
Keywords :
bioelectric phenomena; biological effects of fields; biomembranes; calcium; cellular biophysics; tumours; 10 ns; Ca; apoptosis; biological cells; cell death; cell immobilization; charging time; electric field interactions; electrical model; gene; human cells; intracellular electroeffect; intracellular free calcium levels; intracellular granule membranes; intracellular structures; pulsed electric fields; tumors; ultrashort electrical pulses; Biological cells; Biological system modeling; Biomembranes; Calcium; Cells (biology); Electromagnetic fields; Magnetic resonance; Narrowband; Neoplasms; Predictive models;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2004.829009