Title :
Dip testing, a new method for measuring cathode activity
Author_Institution :
Bell Telephone Labs. Inc., Murray Hill, N. J.
Keywords :
Anodes; Cathodes; Chemicals; Current measurement; Electron devices; Pulse measurements; Reproducibility of results; Temperature; Temperature dependence; Testing; Time measurement; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14327
