Title :
RF MEMS Testing - Beyond the S-Parameters
Author :
Ebel, John L. ; Hyman, Daniel J. ; Newman, Harvey S.
Author_Institution :
Wright-Patterson AFB, Wright-Patterson AFB
Abstract :
This article surveys a variety of tests and measurements that have been used for switch and relay characterization, and it describes their strengths, weaknesses, and applicability in the design and development process.
Keywords :
S-parameters; microrelays; RF MEMS testing; S-parameters; microrelays; microswitches; Contact resistance; Dielectric losses; Insertion loss; Radio frequency; Radiofrequency microelectromechanical systems; Resonance; Scattering parameters; Switches; System testing; Voltage;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMM.2007.907737
