Title :
Automatic measurement of micro-deviations in periodic structures
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, N. J.
fDate :
4/1/1958 12:00:00 AM
Keywords :
Anodes; Bandwidth; Brightness; Capacitors; Electrodes; Electron tubes; Frequency; Impedance; Noise figure; Oscillators; Periodic structures; Plasma temperature; Switches; Voltage; Voltage control;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14363
