• DocumentCode
    1012575
  • Title

    A fully depleted lean-channel transistor (DELTA)-a novel vertical ultrathin SOI MOSFET

  • Author

    Hisamoto, Digh ; Kaga, Toru ; Kawamoto, Yoshifumi ; Takeda, Eiji

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • Volume
    11
  • Issue
    1
  • fYear
    1990
  • Firstpage
    36
  • Lastpage
    38
  • Abstract
    A fully depleted lean-channel transistor (DELTA) that has a gate with a vertical ultrathin SOI structure is reported. In the deep submicrometer region, selective oxidation is useful in realizing SOI isolation. It provides high crystalline quality, as good as that of conventional bulk single-crystal devices. Using experiments and three-dimensional simulation, it was shown that the gate structure has effective channel controllability and its vertical ultrathin SOI structure provides superior device characteristics.<>
  • Keywords
    insulated gate field effect transistors; semiconductor technology; semiconductor-insulator boundaries; DELTA; SOI isolation; Si-SiO/sub 2/-Si/sub 3/N/sub 4/; deep submicrometer region; device characteristics; effective channel controllability; fully depleted lean-channel transistor; gate structure; high crystalline quality; selective oxidation; three-dimensional simulation; vertical ultrathin SOI MOSFET; Controllability; Crystallization; Etching; Fabrication; Impedance; MOSFET circuits; Oxidation; Substrates; Transistors; Ultra large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.46923
  • Filename
    46923