DocumentCode
1012575
Title
A fully depleted lean-channel transistor (DELTA)-a novel vertical ultrathin SOI MOSFET
Author
Hisamoto, Digh ; Kaga, Toru ; Kawamoto, Yoshifumi ; Takeda, Eiji
Author_Institution
Hitachi Ltd., Tokyo, Japan
Volume
11
Issue
1
fYear
1990
Firstpage
36
Lastpage
38
Abstract
A fully depleted lean-channel transistor (DELTA) that has a gate with a vertical ultrathin SOI structure is reported. In the deep submicrometer region, selective oxidation is useful in realizing SOI isolation. It provides high crystalline quality, as good as that of conventional bulk single-crystal devices. Using experiments and three-dimensional simulation, it was shown that the gate structure has effective channel controllability and its vertical ultrathin SOI structure provides superior device characteristics.<>
Keywords
insulated gate field effect transistors; semiconductor technology; semiconductor-insulator boundaries; DELTA; SOI isolation; Si-SiO/sub 2/-Si/sub 3/N/sub 4/; deep submicrometer region; device characteristics; effective channel controllability; fully depleted lean-channel transistor; gate structure; high crystalline quality; selective oxidation; three-dimensional simulation; vertical ultrathin SOI MOSFET; Controllability; Crystallization; Etching; Fabrication; Impedance; MOSFET circuits; Oxidation; Substrates; Transistors; Ultra large scale integration;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.46923
Filename
46923
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