Title :
A fully depleted lean-channel transistor (DELTA)-a novel vertical ultrathin SOI MOSFET
Author :
Hisamoto, Digh ; Kaga, Toru ; Kawamoto, Yoshifumi ; Takeda, Eiji
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Abstract :
A fully depleted lean-channel transistor (DELTA) that has a gate with a vertical ultrathin SOI structure is reported. In the deep submicrometer region, selective oxidation is useful in realizing SOI isolation. It provides high crystalline quality, as good as that of conventional bulk single-crystal devices. Using experiments and three-dimensional simulation, it was shown that the gate structure has effective channel controllability and its vertical ultrathin SOI structure provides superior device characteristics.<>
Keywords :
insulated gate field effect transistors; semiconductor technology; semiconductor-insulator boundaries; DELTA; SOI isolation; Si-SiO/sub 2/-Si/sub 3/N/sub 4/; deep submicrometer region; device characteristics; effective channel controllability; fully depleted lean-channel transistor; gate structure; high crystalline quality; selective oxidation; three-dimensional simulation; vertical ultrathin SOI MOSFET; Controllability; Crystallization; Etching; Fabrication; Impedance; MOSFET circuits; Oxidation; Substrates; Transistors; Ultra large scale integration;
Journal_Title :
Electron Device Letters, IEEE