DocumentCode :
1012575
Title :
A fully depleted lean-channel transistor (DELTA)-a novel vertical ultrathin SOI MOSFET
Author :
Hisamoto, Digh ; Kaga, Toru ; Kawamoto, Yoshifumi ; Takeda, Eiji
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Volume :
11
Issue :
1
fYear :
1990
Firstpage :
36
Lastpage :
38
Abstract :
A fully depleted lean-channel transistor (DELTA) that has a gate with a vertical ultrathin SOI structure is reported. In the deep submicrometer region, selective oxidation is useful in realizing SOI isolation. It provides high crystalline quality, as good as that of conventional bulk single-crystal devices. Using experiments and three-dimensional simulation, it was shown that the gate structure has effective channel controllability and its vertical ultrathin SOI structure provides superior device characteristics.<>
Keywords :
insulated gate field effect transistors; semiconductor technology; semiconductor-insulator boundaries; DELTA; SOI isolation; Si-SiO/sub 2/-Si/sub 3/N/sub 4/; deep submicrometer region; device characteristics; effective channel controllability; fully depleted lean-channel transistor; gate structure; high crystalline quality; selective oxidation; three-dimensional simulation; vertical ultrathin SOI MOSFET; Controllability; Crystallization; Etching; Fabrication; Impedance; MOSFET circuits; Oxidation; Substrates; Transistors; Ultra large scale integration;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.46923
Filename :
46923
Link To Document :
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