Magnetostatic and recording analysis of RF-sputtered double layer media for perpendicular recording

Author

Luitjens, S.B. ; Schrauwen, C.P.G. ; Bernards, J.P.C. ; Zieren, V.

Author_Institution

Philips Research Laboratories, JA Eindhoven, The Netherlands

Volume

21

Issue

5

fYear

1985

fDate

9/1/1985 12:00:00 AM

Firstpage

1438

Lastpage

1440

Abstract

The paper describes the preparation, characterization and properties of RF-sputtered double-layer (DL) media for perpendicular magnetic recording. The media, consisting of CoCr on top of a soft magnetic NiFe layer, are deposited on Si wafers or polyester (PET) foils. The influence of an intermediate layer on the magnetic properties such as the NiFe coercivity, is described in terms of magnetostatic (de)coupling. In-contact recording experiments using ring heads include signal as well as noise measurements. Spike noise is observed in low-Hc(NiFe) DL media, which probably may be ascribed to domain-wall displacements in the underlayer. The relation between the noise output and Hc(NiFe) is shown.

Keywords

Magnetic tape recording; Perpendicular magnetic recording; Coercive force; Magnetic analysis; Magnetic domains; Magnetic heads; Magnetic properties; Magnetostatics; Noise measurement; Perpendicular magnetic recording; Positron emission tomography; Soft magnetic materials;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.1985.1064016

Filename

1064016