Title :
Ultra high-speed switching transistor
Author :
Thornton, C. ; McCotter, J. ; Angell, J.
Author_Institution :
Philco Corp. Lansdale, Pa.
fDate :
4/1/1958 12:00:00 AM
Keywords :
Circuit testing; Cutoff frequency; Fabrication; Gain measurement; Geometry; Germanium; Impurities; Performance gain; Power measurement; Production; Silicon; Switches; VHF circuits; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14397