DocumentCode :
1012862
Title :
A leakage-tolerant low-swing circuit style in partially depleted silicon-on-insulator CMOS technologies
Author :
Kim, Jae-Joon ; Roy, Kaushik
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
14
Issue :
5
fYear :
2006
fDate :
5/1/2006 12:00:00 AM
Firstpage :
549
Lastpage :
552
Abstract :
The parasitic bipolar leakage and the large subthreshold leakage due to high floating-body voltage reduce the noise margin and increase the delay of the circuits in the partially depleted silicon-on-insulator (PD/SOI). Differential cascode voltage switch logic (DCVSL) has circuit topologies susceptible to the leakage currents. In this paper, we propose a new circuit style to effectively handle the leakage problems in PD/SOI DCVSL. The proposed low-swing DCVSL (LS-DCVSL) uses the small internal swing to prevent the body of evaluation transistors from being charged to high voltage and, hence, suppress the leakages in DCVSL. Simulation results show that the proposed LS-DCVSL five-input XOR circuit is 33% faster than DCVSL five-input XOR circuit. In addition, the proposed circuit does not experience noise margin reduction due to pass-gate leakage.
Keywords :
CMOS integrated circuits; logic circuits; silicon-on-insulator; CMOS technologies; circuit simulation; evaluation transistors; leakage tolerant; low swing circuit style; noise margin reduction; partially depleted silicon-on-insulator; pass gate leakage; CMOS logic circuits; CMOS technology; Circuit noise; Delay; Noise reduction; Silicon on insulator technology; Subthreshold current; Switches; Switching circuits; Voltage; CMOS integrated circuits; delay; noise; silicon-on-insulator (SOI) technology;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2006.876110
Filename :
1650232
Link To Document :
بازگشت