Title :
A temperature-modulated probe for potential measurements within electron beams
Author_Institution :
Stanford University, Stanford, Calif.
fDate :
4/1/1958 12:00:00 AM
Keywords :
Assembly; Atmosphere; Cathodes; Ceramics; Cleaning; Diodes; Electron beams; Electron devices; Electron tubes; Etching; Pollution measurement; Probes; Titanium; Voltage;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14400
