DocumentCode :
1013041
Title :
1.7 kV NPTV-groove clustered IGBT
Author :
Spulber, O. ; Sweet, M. ; Vershinin, K. ; Luther-King, N. ; De Souza, M.M. ; Sankara-Narayanan, E.M. ; Flores, D. ; Millan, J.
Author_Institution :
Emerging Technol. Res. Centre, De Montfort Univ., Leicester, UK
Volume :
151
Issue :
3
fYear :
2004
fDate :
6/17/2004 12:00:00 AM
Firstpage :
265
Lastpage :
268
Abstract :
A novel MOS-gated thyristor with excellent current saturation capability has been fabricated in 1.7 kV NPT technology. The new device uses V-groove trench gates fabricated by TMAH chemical etching to reduce fabrication costs. Experimental results demonstrate that the new V-groove CIGBT displays a good forward voltage drop of 2.2 V owing to the incorporation of the thyristor concept, which represents 18% improvement in comparison to state-of-the-art 1.7 kV NPT TIGBT. Moreover, the new V-groove CIGBT has been switched off in an inductive circuit and was tested under short-circuit conditions for 10 μs.
Keywords :
high-voltage techniques; losses; power integrated circuits; power transistors; switching; carrier injection control; dual gate lateral inversion layer emitter transistor; high voltage integrated circuits; loss reduction; on-state loss; power integrated circuits; switching frequency; turn-off loss; ultra-fast switching capability;
fLanguage :
English
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2409
Type :
jour
DOI :
10.1049/ip-cds:20040446
Filename :
1306932
Link To Document :
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