Title :
Large-signal rise-times in junction transistors
Author_Institution :
U. S. Army Signal Eng. Labs. Fort Monmouth, N. J.
Keywords :
Capacitance measurement; Charge carrier lifetime; Circuits; Current measurement; Cutoff frequency; Electrical resistance measurement; Electron devices; Frequency; Impedance; Laplace equations; Production facilities; Pulse amplifiers; Transient response;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1958.14439
