• DocumentCode
    1013269
  • Title

    Subthreshold current in MODFETs of tenth-micrometer gate

  • Author

    Jiang, Chun ; Tsui, Daniel C. ; Lin, B.J.F. ; Lee, H. ; Lepore, A. ; Levy, M.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • Volume
    11
  • Issue
    1
  • fYear
    1990
  • Firstpage
    63
  • Lastpage
    65
  • Abstract
    The subthreshold current of conventional GaAs/AlGaAs MODFETs and pseudomorphic InGaAs/AlGaAs MODFETs with the gate length down to 0.12 mu m is investigated. The gate swing increases with the drain voltage and decreases with the gate length. It is attributed to charge injection from source to drain, limited by the channel potential barrier, which is a function of both the drain and the gate voltages. The pseudomorphic InGaAs/AlGaAs MODFETs show much better control than the conventional GaAs/AlGaAs MODFETs for the subthreshold current, especially with high drain biases. This shows that the pseudomorphic quantum-well structures can suppress the subthreshold current passing through the GaAs buffer region and reduce the undesirable short-channel effects.<>
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; 0.12 micron; GaAs buffer region; GaAs-AlGaAs transistor; InGaAs-AlGaAs; channel potential barrier; charge injection; conventional MODFET; drain voltage; gate length; gate swing; high drain biases; pseudomorphic MODFET; pseudomorphic quantum-well structures; short-channel effects; subthreshold current; Doping; Gallium arsenide; HEMTs; Indium gallium arsenide; Leakage current; MODFETs; Quantum wells; Subthreshold current; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.46932
  • Filename
    46932