DocumentCode :
1013479
Title :
A physical theory of junction transistors in the collector-voltage-saturation region
Author :
Huang, Chaang
Author_Institution :
Sylvania Electric Products Inc., Semiconductor Div., Woburn, Mass
Volume :
6
Issue :
2
fYear :
1959
fDate :
4/1/1959 12:00:00 AM
Firstpage :
141
Lastpage :
153
Abstract :
A physical theory has been formulated for the operation of junction transistors in the "collector-voltage-saturation" region or "on" region. Transistor characteristics in this region are important for switching applications, Class A or Class B amplifiers, as well as other large signal applications. The formulation is based on the physical consideration that in the "collector-voltage-saturation" region the collector-base junction is forwardly biased, and that the injection level is high. Two-dimensional distributions of carrier densities, current densities, and electric field are obtained for separate portions of the base region. Using these distributions, theoretical expressions are derived for the characteristics of p-n-p and n-p-n transistors including saturation voltage, base input voltage, and dc current amplification factor. Good agreement between theoretical and experimental results indicates that the approximations used in the theory are valid. Numerical calculations have been carried out for the saturation voltage, base input voltage, and dc current amplification factor for different geometrics and material properties. The calculation illustrates the use of the theory for quantitative designs of transistor characteristics.
Keywords :
Avalanche breakdown; Charge carrier density; Current density; Electric breakdown; Geometry; Germanium; Helium; Material properties; P-n junctions; Space charge; Sparks; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1959.14465
Filename :
1472508
Link To Document :
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