• DocumentCode
    1013484
  • Title

    Fault-tolerant design strategies for high reliability and safety

  • Author

    Vaidya, Nitin H. ; Pradhan, Dhiraj K.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • Volume
    42
  • Issue
    10
  • fYear
    1993
  • fDate
    10/1/1993 12:00:00 AM
  • Firstpage
    1195
  • Lastpage
    1206
  • Abstract
    Several fundamental results related to reliability and safety are analyzed. Modular redundant systems consisting of multiple identical modules and an arbiter are considered. It is shown that for a given level of redundancy, a large number of implementation alternatives exist with varying degree of reliability and safety. Strategies are formulated that achieve a maximal combination of reliability and safety. The effect of increasing the number of modules on system reliability and safety is analyzed. It is shown that when one considers safety in addition to reliability, it does not necessarily help to simply add modules to the system. Specifically, increasing the number of modules by just one does not always improve both reliability and safety. To improve reliability and safety simultaneously, at least two additional modules are required when the outputs of the individual modules do not have any redundant information (e.g., coding for error detection). However, it is shown that if the modules themselves have built-in error detection capability, addition of just one module may be sufficient to improve both reliability and safety
  • Keywords
    computer interfaces; error detection; fault tolerant computing; redundancy; arbiter; built-in error detection; fault-tolerant design strategies; high reliability; modular redundant systems; multiple identical modules; safety; Aerospace control; Aircraft; Computer science; Control systems; Error correction; Fault tolerance; Fault tolerant systems; Redundancy; Reliability; Safety;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.257706
  • Filename
    257706