Title :
Multiview registration of 3D scenes by minimizing error between coordinate frames
Author :
Sharp, Gregory C. ; Lee, Sang W. ; Wehe, David K.
Author_Institution :
Dept. of Radiat. Oncology, Massachusetts Gen. Hosp., Boston, MA, USA
Abstract :
This paper addresses the problem of large-scale multiview registration of range images captured from unknown viewing directions. To reduce the computational burden, we separate the local problem of pairwise registration on neighboring views from the global problem of distribution of accumulated errors. We define the global problem as an optimization over the graph of neighboring views, and we show how the graph can be decomposed into a set of cycles such that the optimal transformation parameters for each cycle can be solved in closed form. We then describe an iterative procedure that can be used to integrate the solutions for the set of cycles across the graph of views. This method for error distribution does not require point correspondences between views, and can be used to integrate any method of pairwise registration or robot odometry.
Keywords :
computer graphics; graph theory; image registration; iterative methods; optimisation; 3D scenes multiview registration; error distribution; graph analysis; iterative method; large scale multiview image registration; optimal transformation parameters; optimization; pairwise registration method; robot odometry method; Distributed computing; Image analysis; Iterative algorithms; Iterative methods; Large-scale systems; Layout; Maximum likelihood estimation; Registers; Robot kinematics; Shape; Registration; global registration; graph analysis.; multiple views; range images; Algorithms; Artificial Intelligence; Computer Graphics; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2004.49