DocumentCode
1013959
Title
Direct measurement for the characteristic parameters of magnetic microstrip substrate
Author
Zhu, Sheng-chuan ; Zhao, Li-qun
Author_Institution
Peking University, Beijing, China
Volume
21
Issue
5
fYear
1985
fDate
9/1/1985 12:00:00 AM
Firstpage
1800
Lastpage
1802
Abstract
We suggest a method for directly measuring the characteristic parameters of a microstrip substrate. By using a reflex ring resonator, the microstrip wavelength λm , the parameter
(correspond to the reduce phase constant) and the attenuation constant α can be determined conveniently and precisely.
(correspond to the reduce phase constant) and the attenuation constant α can be determined conveniently and precisely.Keywords
Microstrip; YIG materials/devices; Attenuation; Dielectric substrates; Frequency measurement; Micromagnetics; Microstrip resonators; Optical ring resonators; Permeability; Q measurement; Resonant frequency; Wavelength measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1985.1064130
Filename
1064130
Link To Document