• DocumentCode
    1013959
  • Title

    Direct measurement for the characteristic parameters of magnetic microstrip substrate

  • Author

    Zhu, Sheng-chuan ; Zhao, Li-qun

  • Author_Institution
    Peking University, Beijing, China
  • Volume
    21
  • Issue
    5
  • fYear
    1985
  • fDate
    9/1/1985 12:00:00 AM
  • Firstpage
    1800
  • Lastpage
    1802
  • Abstract
    We suggest a method for directly measuring the characteristic parameters of a microstrip substrate. By using a reflex ring resonator, the microstrip wavelength λm, the parameter \\sqrt {\\mu_{e}\\varepsilon _{e}} (correspond to the reduce phase constant) and the attenuation constant α can be determined conveniently and precisely.
  • Keywords
    Microstrip; YIG materials/devices; Attenuation; Dielectric substrates; Frequency measurement; Micromagnetics; Microstrip resonators; Optical ring resonators; Permeability; Q measurement; Resonant frequency; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1985.1064130
  • Filename
    1064130