Title :
Theoretical life expectancy of oxide cathodes
Author_Institution :
General Electric Co., Owensboro, Ky.
fDate :
4/1/1959 12:00:00 AM
Keywords :
Audio systems; Brightness; Cathodes; Chemical elements; Circuits; Coatings; Degradation; Diodes; Electrodes; Electron tubes; Glass; Jacobian matrices; Laboratories; Nickel; Parasitic capacitance; Surface resistance; Temperature; Transconductance;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1959.14539
