DocumentCode :
1014245
Title :
Reliability of checkpointed real-time systems using time redundancy
Author :
Krishna, C.M. ; Singh, Adit D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Volume :
42
Issue :
3
fYear :
1993
fDate :
9/1/1993 12:00:00 AM
Firstpage :
427
Lastpage :
435
Abstract :
Real-time computers are often used in embedded, life-critical applications where high reliability is important. A common approach to making such systems dependable is to vote on redundant processors executing multiple copies of the same task is described. The processors which make up such voted systems are subjected not only to independently occurring permanent and transient failure, but also to correlated transients brought about by electromagnetic interference from the operating environment. To counteract these transients, checkpointing and time redundancy are required, in addition to processor redundancy. This work analyzes the use of time and device redundancy in systems subject to correlated failure. The tradeoffs in checkpoint placement in such a system are found to be considerably different from those for non-redundant systems without real-time constraints. The authors compare fault-tolerant designs and without a rollback capability, accounting for the increased hardware-failure rate due to processor duplication when faults are detected in hardware, and the doubled execution times when detection is implemented in software
Keywords :
fault tolerant computing; real-time systems; redundancy; reliability theory; checkpointed real-time systems; correlated transients; electromagnetic interference; fault-tolerant designs; real time computers; redundant processors; reliability; time redundancy; transient failure; voted systems; Application software; Checkpointing; Electromagnetic interference; Electromagnetic transients; Embedded computing; Failure analysis; Fault detection; Real time systems; Redundancy; Voting;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.257826
Filename :
257826
Link To Document :
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