Title :
Reliability of 3-state device systems with simultaneous failures
Author :
Satoh, Naoto ; Sasaki, Motoharu ; Yuge, Tetushi ; Yanagi, Shigeru
Author_Institution :
Dept. of Electr. Eng., Nat. Defense Acad., Yokosuka, Japan
fDate :
9/1/1993 12:00:00 AM
Abstract :
This work is concerned with computing the reliability of redundant systems of three-state (e.g., good, failed-open or failed-short) devices. Allowing for multiple failures, formulas are presented for calculating the reliability of a parallel-series system or a series-parallel system which is formed from three-state, non-DFM (dual failure-mode) devices, and which might require multiple paths to function. The words series and parallel are used in the layout-diagram sense. The formulation encompasses cases which have been analyzed by complex methods in numerous papers on the reliability of three-state DFM device systems. The effects of dominant failure-modes on the relationship between reliability of a series system and that of a parallel system, and on the relationship between the reliability of a parallel-series system and that of series-parallel system are presented
Keywords :
failure analysis; probability; redundancy; reliability theory; 3-state device systems; dominant failure-modes; failed-open devices; failed-short devices; good devices; layout-diagram sense; multiple failures; nondual failure mode devices; parallel-series system; redundant systems; reliability; series-parallel system; simultaneous failures; Art; Current; Design for manufacture; Failure analysis; Logic devices; Mathematical model; Redundancy; Relays; Reliability theory; Wire;
Journal_Title :
Reliability, IEEE Transactions on
