• DocumentCode
    1014344
  • Title

    New methods for the measurement of cathode interface impedance

  • Author

    Frost, H.B.

  • Author_Institution
    Bell Telephone Labs., Inc., Murray Hill, N. J.
  • Volume
    6
  • Issue
    3
  • fYear
    1959
  • fDate
    7/1/1959 12:00:00 AM
  • Firstpage
    315
  • Lastpage
    321
  • Abstract
    Two improved methods for the measurement of cathode interface impedance have been developed, and their limitations have been analyzed. One of these, the complementary network method, is an improvement of a technique disclosed at the IRE National Convention in 1952. The other, the shunt admittance bridge, has not been described previously. Both methods allow the measurement of impedance with both small resistance and short time constant, well below the limit, 50 ohms at 0.1 µsec, of most present equipments. With the development of improved cathode alloys, the measurement of interface impedances having short time constants and low resistances has become important to control this parameter in manufacture and to obtain further improvement. For the complementary-network bridge, the theoretical analysis has shown the extreme importance of minimizing stray inductance in the complementary network. When corrections are applied, the complementary-network bridge has good accuracy, with less than one-ohm error at 10 ohms and 0.05 µsec and lower relative errors for higher resistances. The shunt admittance bridge is most satisfactory when tubes with transconductances greater than 10,000 µmho are to be measured. An impedance transformation is used which allows much easier physical realization of the measurement network than in other interface measurement methods. For tubes with transconductances greater than 10,000 µmho, the shunt admittance bridge will provide accurate time constant and resistance data down to 0.02 µsec and 5 ohms.
  • Keywords
    Admittance; Bridges; Cathodes; Electrical resistance measurement; Electron devices; Electron tubes; Error correction; Frequency; Impedance measurement; Inductance; Testing; Time measurement; Wideband;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1959.14554
  • Filename
    1472597