DocumentCode :
1014385
Title :
200°C operation of semiconductor power devices
Author :
Johnson, R. Wayne ; Bromstead, James R. ; Weir, G. Bennett
Author_Institution :
Dept. of Electr. Eng., Auburn Univ., AL, USA
Volume :
16
Issue :
7
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
759
Lastpage :
764
Abstract :
There is a growing need for commercial and military power electronics to operate above 175°C. Changes in operating parameters at 200°C have been measured for four devices, an NPN bipolar junction transistor (BJT), an insulated gate bipolar transistor (IGBT), an N-channel metal-oxide-semiconductor field effect transistor (MOSFET), and a P-type MOS controlled thyristor (MCT). Using the results of these measurements, power supplies have been built using IGBTs and MOSFETs and operated at an ambient temperature of 200°C for up to 72 h
Keywords :
bipolar transistors; insulated gate bipolar transistors; insulated gate field effect transistors; power electronics; power transistors; thyristors; 200 degC; 72 h; IGBTs; N-channel MOSFET; NPN bipolar junction transistor; P-type MOS controlled thyristor; ambient temperature; commercial power electronics; insulated gate bipolar transistor; military power electronics; operating parameters; power supplies; semiconductor power devices; Circuit testing; Current measurement; Force measurement; Insulated gate bipolar transistors; Leakage current; MOSFET circuits; Pulse measurements; Temperature dependence; Thyristors; Voltage measurement;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.257855
Filename :
257855
Link To Document :
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