• DocumentCode
    1014385
  • Title

    200°C operation of semiconductor power devices

  • Author

    Johnson, R. Wayne ; Bromstead, James R. ; Weir, G. Bennett

  • Author_Institution
    Dept. of Electr. Eng., Auburn Univ., AL, USA
  • Volume
    16
  • Issue
    7
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    759
  • Lastpage
    764
  • Abstract
    There is a growing need for commercial and military power electronics to operate above 175°C. Changes in operating parameters at 200°C have been measured for four devices, an NPN bipolar junction transistor (BJT), an insulated gate bipolar transistor (IGBT), an N-channel metal-oxide-semiconductor field effect transistor (MOSFET), and a P-type MOS controlled thyristor (MCT). Using the results of these measurements, power supplies have been built using IGBTs and MOSFETs and operated at an ambient temperature of 200°C for up to 72 h
  • Keywords
    bipolar transistors; insulated gate bipolar transistors; insulated gate field effect transistors; power electronics; power transistors; thyristors; 200 degC; 72 h; IGBTs; N-channel MOSFET; NPN bipolar junction transistor; P-type MOS controlled thyristor; ambient temperature; commercial power electronics; insulated gate bipolar transistor; military power electronics; operating parameters; power supplies; semiconductor power devices; Circuit testing; Current measurement; Force measurement; Insulated gate bipolar transistors; Leakage current; MOSFET circuits; Pulse measurements; Temperature dependence; Thyristors; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.257855
  • Filename
    257855