Title :
A Universal VLSI Architecture for Reed–Solomon Error-and-Erasure Decoders
Author :
Chang, Hsie-Chia ; Lin, Chien-Ching ; Chang, Fu-Ke ; Lee, Chen-Yi
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
This paper presents a universal architecture for Reed-Solomon (RS) error-and-erasure decoder. In comparison with other reconfigurable RS decoders, our universal approach based on Montgomery multiplication algorithm can support not only arbitrary block length but various finite-field degree within different irreducible polynomials. Moreover, the decoder design also features the constant multipliers in the universal syndrome calculator and Chien search block, as well as an on-the-fly inversion table for calculating error or errata values. After implemented with 0.18-mum 1P6M technology, the proposed universal RS decoder correcting up to 16 errors can be measured to reach a maximum 1.28 Gb/s data rate at 160 MHz. The total gates count is around 46.4 K with 1.21 mm2 silicon area, and the average core power consumption is 68.1 mW.
Keywords :
Reed-Solomon codes; VLSI; codecs; 1P6M technology; Chien search block; Montgomery multiplication algorithm; Reed-Solomon error-and-erasure decoder; average core power consumption; bit rate 1.28 Gbit/s; decoder design; frequency 160 MHz; multipliers; polynomial; power 68.1 mW; size 0.18 mum; universal VLSI architecture; universal syndrome calculator; Error-and-erasure correction; Montgomery multiplication; Reed–Solomon (RS) code; universal architecture;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2008.2010143