Title :
E-pulse discrimination of R-cards in a layered environment
Author :
Rothwell, Edward J. ; Kempel, Leo C. ; Frasch, L.L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fDate :
7/1/2006 12:00:00 AM
Abstract :
The feasibility of using the E-pulse technique to identify the values of a resistance card (R-card) contained within a material stack is demonstrated. The late-time response of a material stack is modeled as a resonance series and an E pulse is constructed to extinguish this response. Results using measured data show that it is possible to identify the R-card value from among five potential candidates.
Keywords :
dielectric bodies; dielectric materials; electromagnetic fields; electromagnetic wave reflection; E-pulse discrimination technique; late-time response; material stack; resistance card; resonance series; Antenna measurements; Dielectric materials; Dielectric measurements; Permittivity measurement; Probability density function; Radar scattering; Remote sensing; Resonance; Shape control; Stokes parameters; Electromagnetic transient scattering; nondestructive testing; radar target recognition;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2006.877208
