Title :
Design Migration From Peripheral ASIC Design to Area-I/O Flip-Chip Design by Chip I/O Planning and Legalization
Author :
Chang, Chia-Yi ; Chen, Hung-Ming
Author_Institution :
Sunplus Technol., Hsinchu
Abstract :
Due to higher input/output (I/O) count and power delivery problem in deep submicrometer (DSM) regime, flip-chip technology, especially for area-array architecture, has provided more opportunities for adoption than traditional peripheral bonding design style in high-performance application-specific integrated circuit and microprocessor designs. However, it is hard to tell which technique can provide better design cost edge in usually concerned perspectives. In this paper, we present a methodology to convert a previous peripheral bonding design to an area-I/O flip-chip design. It is based on an I/O buffer modeling and an I/O planning algorithm to legalize I/O buffer blocks with core placement without sacrificing much of the previous optimization in the original core placement. The experimental results have shown that we have achieved better area and I/O wirelength in area-IO flip-chip configuration (especially for pad-limit designs), compared with peripheral bonding configuration in packaging consideration.
Keywords :
application specific integrated circuits; electronics packaging; flip-chip devices; integrated circuit bonding; integrated circuit design; I/O planning algorithm; area-I/O flip-chip design; area-array architecture; chip I/O planning; deep submicrometer regime; design migration; input/output count; microprocessor designs; packaging consideration; peripheral application-specific integrated circuit design; peripheral bonding design; power delivery problem; Application specific integrated circuits; Bonding; Costs; Electrostatic discharge; Integrated circuit technology; Load flow; Load flow analysis; Microprocessors; Packaging; Technology planning; Area-array flip-chip; design migration; input/output (I/O) planning and legalization;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2007.912202