DocumentCode
1015031
Title
Rigorous analysis of coupling in dielectric resonators
Author
Bhattacharjee, T. ; Tu, Xuan
Author_Institution
Dept. of Electr. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Volume
26
Issue
2
fYear
1990
fDate
3/1/1990 12:00:00 AM
Firstpage
735
Lastpage
738
Abstract
A theoretical analysis is presented of a shielded dielectric resonator (DR) structure consisting of a DR placed on a dielectric substrate with a very low dielectric constant spacer in-between and enclosed by a metallic shielding. The field equations are obtained by using both the axial mode-matching method and the radial mode-matching method. The technique used in the analysis is based on dividing the resonator structure into partial regions and regarding these as sections of dielectrically loaded waveguides. The resulting transcendental equation is obtained by enforcing the continuity of the tangential field components inside each partial region as well as the condition of vanishing tangential electric field on the metallic enclosure. As an example, a simplified version of the DR configuration has been solved and numerically evaluated using the theory of the mode matching method to obtain the coupling coefficient between a microstrip line and the magnetically coupled DR. The results are in good agreement with the experimental values
Keywords
dielectric resonators; electromagnetic fields; numerical methods; strip line components; waveguide theory; axial mode-matching method; coupling coefficient; dielectric substrate; dielectrically loaded waveguides; field equations; magnetically coupled DR; metallic enclosure; metallic shielding; microstrip line; radial mode-matching method; shielded dielectric resonator structure; tangential field components; theoretical analysis; transcendental equation; Boundary conditions; Couplings; Dielectric substrates; Equations; Loaded waveguides; Magnetic separation; Microstrip; Mode matching methods; Space technology; Waveguide components;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.106423
Filename
106423
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