DocumentCode :
1015051
Title :
Tunable liquid-crystal Fabry-Perot interferometer filter for wavelength-division multiplexing communication systems
Author :
Hirabayashi, Katsuhiko ; Tsuda, Hiroyuki ; Kurokawa, Takashi
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
Volume :
11
Issue :
12
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
2033
Lastpage :
2043
Abstract :
We explain how to obtain the bandwidth and tunable range required for wavelength-division multiplexing communication systems and how to design tunable liquid-crystal Fabry-Perot interferometer filters. The main factors determining the performance are liquid-crystal loss, mirror loss, surface roughness, and parallelism, as well as mirror reflectivity and cavity gap. Experimental results closely agree with the designed performance. Temperature dependence, response time, acceptable input power, and reliability are investigated. Pigtailed polarization-independent filter modules with a Peltier controller are made and are shown to have low polarization dependence (<0.3 dB), low driving voltage (<15 V), and compact size, as well as a narrow bandwidth (0.3 nm), high finesse of 189, and large tunable range (50 nm)
Keywords :
light interferometers; liquid crystal devices; multiplexing equipment; optical communication equipment; optical design techniques; optical filters; reflectivity; reliability; tuning; wavelength division multiplexing; 5 V; Peltier controller; WDM; acceptable input power; bandwidth; cavity gap; compact size; high finesse; large tunable range; liquid-crystal Fabry-Perot interferometer filter design; liquid-crystal loss; low driving voltage; mirror loss; mirror reflectivity; optical filter design; pigtailed polarization-independent filter modules; reliability; response time; surface roughness; temperature dependence; tunable liquid-crystal Fabry-Perot interferometer filter; tunable range; wavelength-division multiplexing communication systems; Bandwidth; Fabry-Perot interferometers; Filters; Mirrors; Performance loss; Polarization; Reflectivity; Rough surfaces; Surface roughness; Wavelength division multiplexing;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.257967
Filename :
257967
Link To Document :
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