DocumentCode :
1015124
Title :
Removal of spurious DC modes in edge element solutions for modeling three-dimensional resonators
Author :
Venkatarayalu, Neelakantam V. ; Lee, Jin-Fa
Author_Institution :
Temasek Labs. & the Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
Volume :
54
Issue :
7
fYear :
2006
fDate :
7/1/2006 12:00:00 AM
Firstpage :
3019
Lastpage :
3025
Abstract :
When using edge element basis functions for the solution of eigenmodes of the vector wave equation, "dc spurious modes" are introduced. The eigenvalues of these modes are zero and their corresponding eigenvectors are in the space of the curl operator. These modes arise due to the irrotational vector space spanned by the edge element basis functions and lead to nonzero divergence of the electric flux. We introduce a novel method to eliminate the occurrence of such solutions using "divergence-free" constraint equations. The constraint equations are imposed efficiently by tree-cotree partitioning of the finite-element mesh and does not require any basis functions other than the edge elements. The constraint equations can be directly incorporated into any Krylov-subspace-based eigenvalue solver, such as the Lanczos/Arnoldi algorithm used widely for the solution of generalized sparse eigenvalue problems.
Keywords :
eigenvalues and eigenfunctions; finite element analysis; resonators; trees (mathematics); 3D resonators; Krylov-subspace-based eigenvalue solver; divergence-free constraint equations; edge element basis functions; edge element solutions; electric flux; finite-element mesh; nonzero divergence; spurious DC modes; tree-cotree partitioning; vector wave equation; Eigenvalues and eigenfunctions; Finite element methods; Laboratories; Lead; Microwave theory and techniques; Null space; Partial differential equations; Partitioning algorithms; Poisson equations; Vectors; Constraint equations; Lanczos algorithm; finite-element method (FEM); spurious modes;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2006.877057
Filename :
1650442
Link To Document :
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