DocumentCode
1015348
Title
Process variables which affect germanium transistor reliability
Author
Dienel, H.F.
Author_Institution
Bell Telephone Labs., Inc., Allentown, Pa.
Volume
7
Issue
2
fYear
1960
fDate
4/1/1960 12:00:00 AM
Firstpage
115
Lastpage
115
Keywords
Bandwidth; Coupling circuits; Frequency; Gain; Germanium; Low-noise amplifiers; Masers; Noise figure; Noise measurement; Power amplifiers; Silicon; Switching circuits; Waveguide discontinuities;
fLanguage
English
Journal_Title
Electron Devices, IRE Transactions on
Publisher
ieee
ISSN
0096-2430
Type
jour
DOI
10.1109/T-ED.1960.14654
Filename
1472761
Link To Document