DocumentCode :
1015352
Title :
On the theoretical determination of the alignment sensitivity of electric and magnetic devices
Author :
Schaefer, C.H.
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, New York. USA
Volume :
21
Issue :
6
fYear :
1985
fDate :
11/1/1985 12:00:00 AM
Firstpage :
2181
Lastpage :
2184
Abstract :
In the computer design of electric and magnetic devices, when the fields can be derived from a scalar potential satisfying the Laplace equation, integral equation methods are powerful tools, particularly in 3-d problems. A certain Fredholm integral equation of the first kind, used first to obtain the potential, may be utilized a second time with a different right-hand side to obtain directly the rate of change in potential due to a change in the position of an electrode or magnet pole-piece. The new right-hand side of the integral equation is formulated in simple terms. Knowledge of this rate of change suggests itself to two types of applications: alignment sensitivity study and improved numerical optimization of electromagnetic devices.
Keywords :
Electrostatic analysis; Fredholm integral equations; Magnetic analysis; Sensitivity analysis/optimization; Apertures; Electrodes; Electromagnetic devices; Electron optics; Electrostatics; Integral equations; Laplace equations; Magnetic devices; Optical distortion; Optical sensors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1985.1064255
Filename :
1064255
Link To Document :
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