• DocumentCode
    1015631
  • Title

    Solar-blind AlGaN-based p-i-n photodiodes with low dark current and high detectivity

  • Author

    Biyikli, N. ; Kimukin, I. ; Aytur, O. ; Ozbay, E.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Bilkent Univ., Ankara, Turkey
  • Volume
    16
  • Issue
    7
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    1718
  • Lastpage
    1720
  • Abstract
    We report solar-blind AlxGa1-xN-based heterojunction p-i-n photodiodes with low dark current and high detectivity. After the p+ GaN cap layer was recess etched, measured dark current was below 3 fA for reverse bias values up to 6 V. The device responsivity increased with reverse bias and reached 0.11 A/W at 261 nm under 10-V reverse bias. The detectors exhibited a cutoff around 283 nm, and a visible rejection of four orders of magnitude at zero bias. Low dark current values led to a high differential resistance of 9.52×1015 Ω. The thermally limited detectivity of the devices was calculated as 4.9×1014 cm·Hz12/W-1.
  • Keywords
    III-V semiconductors; aluminium compounds; etching; gallium compounds; p-i-n photodiodes; semiconductor heterojunctions; wide band gap semiconductors; AlGaN; dark current; detectivity; etching; p-i-n photodiodes; solar-blind AlGaN-based heterojunction; Chemical vapor deposition; Current measurement; Dark current; Detectors; Etching; Fabrication; Gallium nitride; Ohmic contacts; PIN photodiodes; Photodetectors;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2004.829526
  • Filename
    1308276