DocumentCode :
1016381
Title :
A method for the rapid evaluation of semiconductor device reliability
Author :
Howard, B.T. ; Dodson, G.A.
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, N.J.
Volume :
8
Issue :
2
fYear :
1961
fDate :
3/1/1961 12:00:00 AM
Firstpage :
178
Lastpage :
178
Keywords :
Acceleration; Boron; Coatings; Fabrication; Gallium arsenide; Guns; Lenses; Semiconductor device reliability; Semiconductor diodes; Shape; Shape measurement; Silicon; Stress; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1961.14756
Filename :
1472919
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1016381
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