Title :
Electrically tunable frequency klystron
Author :
Musson-Genon, R. ; Favalier, J.
Author_Institution :
Compagnie Francais Thomson Houston, Paris, France
fDate :
3/1/1961 12:00:00 AM
Keywords :
Alloying; Circuit testing; Circuits; Diodes; Encapsulation; Frequency; Germanium; Klystrons; Microwave amplifiers; Noise figure; Refrigeration; Semiconductor diodes; Temperature; Thermoelectricity; Tunable circuits and devices;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1961.14772