DocumentCode
1017218
Title
GaAs heterojunction f.e.t. with epitaxial Ge gate
Author
Anderson, W.T. ; Davey, J.E. ; Christou, Alex ; Bark, M.L. ; Sleger, K.J. ; Dietrich, H.B.
Author_Institution
Naval Research Laboratory, Washington, USA
Volume
15
Issue
1
fYear
1979
Firstpage
11
Lastpage
12
Abstract
A Ge heterojunction-gate GaAs f.e.t. has been developed using p-type epitaxial Ge gates deposited by vacuum evaporation on heated n-type GaAs substrates. Boron-ion implantation of the gate and an aluminium overlay was used to lower the gate resistance. A typical 8 ¿m gate-length device exhibited a noise figure of 5.2 dB with 4.5 dB associated gain at 1.8 GHz.
Keywords
junction gate field effect transistors; p-n heterojunctions; solid-state microwave devices; vapour phase epitaxial growth; 1.8 GHz operation; 4.5 dB gain; 5.2 dB noise figure; 8 micron gate length; Ge heterojunction gate GaAs FET; JFETs; characteristics; p-type epitaxial Ge gates;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19790008
Filename
4255971
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