DocumentCode :
1017527
Title :
Deterministic nanowire fanout and interconnect without any critical translational alignment
Author :
Di Spigna, Neil H. ; Nackashi, David P. ; Amsinck, Christian J. ; Sonkusale, Sachin R. ; Franzon, Paul D.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
Volume :
5
Issue :
4
fYear :
2006
fDate :
7/1/2006 12:00:00 AM
Firstpage :
356
Lastpage :
361
Abstract :
Interfacing the nanoworld with the microworld represents a critical challenge to fully integrated nanosystems. Solutions to this problem have generally required either nanoprecision alignment or stochastic assembly. A design is presented that allows complete and deterministic fanout of regular arrays of wires from the nano- to the microworld without the need for any critical translational alignment steps. For example, deterministically connecting 10-nm wires directly to 3-mum wires would require a translational alignment to within only about 6 mum. The design also allows for nanowire interconnect and is independent of the technology used to fabricate the nanowires, enabling technologies for which alignment remains very challenging. The impact of potential fabrication errors is analyzed and a structure is fabricated that demonstrates the feasibility of such a design
Keywords :
integrated circuit interconnections; nanotechnology; nanowires; critical translational alignment; integrated nanosystems; nanotechnology; nanowire fanout; nanowire interconnect; potential fabrication errors; regular arrays; stochastic assembly; Assembly; Decoding; Error analysis; FETs; Fabrication; Joining processes; Lithography; Nanolithography; Stochastic processes; Wires; Alignment; crossbar architectures; fanout; interconnect; nanoscale interfacing; nanotechnology;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2006.876926
Filename :
1652851
Link To Document :
بازگشت