• DocumentCode
    1017584
  • Title

    Propagation in helical and narrow-band slow wave structures

  • Author

    Bevensee, R.M.

  • Author_Institution
    University of California, Berkeley, Calif.
  • Volume
    8
  • Issue
    6
  • fYear
    1961
  • Firstpage
    549
  • Lastpage
    558
  • Abstract
    A variational analysis is developed for a large class of helical slow-wave structures and illustrated for a narrow tape helix. A 2 × 2 determinantal equation accurately describes the dispersion of the wave with predominant n = 1 mode component, both in the ordinary and anomalous regions. A 3 × 3 determinantal equation would be necessary to describe well the dispersion of the ordinary TWT wave at low frequencies. The analysis is modified to include the presence of a filamentary electron beam. It is shown how the equation for the incremental propagation constant takes the Pierce form, provided the frequency does not lie too near cutoff. A variational analysis is also made of the propagation in a general narrow-band cavity chain interacting with a longitudinally-confined beam. It is shown how the equation for the incremental phase shift per cavity is formally related to Pierce´s equation for the incremental propagation constant in a helix TWT. Provided certain necessary (but not sufficient) conditions are met, an appropriately-defined C3parameter exists for the cavity chain. The resonant-slot coupled cavity chain is treated variationally and it is shown how a very accurate dispersion relation obtains. The waves in this structure interacting with a beam are also described formally, under certain conditions, by the Pierce equation for the TWT.
  • Keywords
    Circuit noise; Diodes; Electrical resistance measurement; Equations; Frequency measurement; Gain measurement; Loss measurement; Low-frequency noise; Narrowband; Noise measurement; Propagation constant; Temperature distribution; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1961.14875
  • Filename
    1473038