Title :
Improving the reliability of the plastic IC package in reflow soldering process by optimization
Author :
Kim, Geun Woo ; Lee, Kang Yong
Author_Institution :
Dept. of Mech. Eng., Yonsei Univ., Seoul, South Korea
fDate :
6/1/2004 12:00:00 AM
Abstract :
In order to reduce stress in the plastic small outline J-lead (SOJ) package and prevent the interface delamination under the infrared (IR) soldering process, parameterization, parametric study and optimization are used. The design variables of dimensions and material properties are determined among all the possible variables from the parametric study. Their optimized values are determined by applying the constraint optimization to the parameterized integrated circuit (IC) package.
Keywords :
delamination; integrated circuit packaging; plastic packaging; reflow soldering; reliability; thermal stresses; constraint optimization; infrared soldering; integrated circuit package; interface delamination prevention; material properties; parameterization; parametric study; plastic IC package reliability; reflow soldering; small outline J-lead package; stress reduction; thermal loading; Constraint optimization; Delamination; Integrated circuit packaging; Material properties; Parametric study; Plastic integrated circuit packaging; Plastic packaging; Reflow soldering; Shape; Thermal stresses; Constraint optimization; IC; package; parameterization; parametric study; plastic integrated circuit; thermal loading;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2004.828561