Title :
Chip-level spray cooling of an LD-MOSFET RF power Amplifier
Author :
Cotler, A.C. ; Brown, E.R. ; Dhir, V. ; Shaw, M.C.
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA
fDate :
6/1/2004 12:00:00 AM
Abstract :
We report here the application of water spray cooling directly to the top surface of a lateral diffused metal oxide semiconductor field effect transistor (LD-MOSFET) in a 500-MHz RF power amplifier. With the amplifier running in Class A, spray cooling at a flow of 0.14 l/min increases the output power from 66 W to 84 W, and the power-added efficiency increases from 26% to 34%, all at 34 W input. This improvement is attributed to a large spray-induced reduction in junction temperature and total package thermal resistance. At the point of highest measured RF output and DC power dissipation, the reduction in junction temperature and total thermal resistance were estimated to be from ≈214°C to ≈115°C and from ≈1.5°C/W to ≈0.6°C/W, respectively, and the maximum spray-induced heat flux was ≈162W/cm2. In Class AB, the increase in output power and power-added efficiency are less, ≈8%, but the amplifier can be driven harder before failure occurs. The maximum output in class AB is 79 W compared to 70 W without spray cooling.
Keywords :
MOSFET; UHF power amplifiers; cooling; insulated gate bipolar transistors; personal communication networks; sprays; thermal resistance; 34 W; 500 MHz; 66 to 84 W; 70 W; 79 W; DC power dissipation; RF output; RF power amplifier; chip-level cooling; field effect transistor; heat flux; insulated gate bipolar transistor; junction temperature reduction; lateral diffusion; low delay-MOSFET; maximum power output; metal oxide semiconductor; output power increase; package thermal resistance resistance; personal communications service; power-added efficiency; solid-state power amplifier; water spray cooling; Cooling; FETs; Power amplifiers; Power generation; Radio frequency; Radiofrequency amplifiers; Semiconductor optical amplifiers; Temperature; Thermal resistance; Thermal spraying; IGBTs; Integrated gate bipolar transistors; LD-MOSFET; PAE; PCS; SSPA; low delay metal oxide semiconductor field effect transistor; personal communications service; power-added efficiency; solid-state power amplifier;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2004.828550