• DocumentCode
    1017796
  • Title

    The underlayer film treatment effect on TbCo film properties in optical disk memory structure

  • Author

    Ichihara, Katsutarou ; Shimanuki, S. ; Yasuda, Nobuaki

  • Author_Institution
    Toshiba Corporation, Kawasaki, Kanagawa, Japan
  • Volume
    22
  • Issue
    5
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    1331
  • Lastpage
    1334
  • Abstract
    A large perpendicular magnetic anisotropy constant (Ku) has been achieved for the TbCo film by introducing a sputter-etching treatment on the dielectric underlayer film before the deposition of the TbCo film. The Kuvalue exceeded 2 × 106erg/cm3by sputter-etching treatment at power densities of 70 mW/cm2or greater. It has also been clarified that sputter-etching treatment contributed to achieving high stability of multilayer media life. The effects of the treatment process are described experimentally.
  • Keywords
    Magnetooptic memories; Perpendicular magnetic anisotropy; Dielectric films; Dielectric substrates; Geometrical optics; Magnetic films; Magnetic properties; Nonhomogeneous media; Optical films; Protection; Saturation magnetization; Semiconductor films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1986.1064467
  • Filename
    1064467