DocumentCode :
1017796
Title :
The underlayer film treatment effect on TbCo film properties in optical disk memory structure
Author :
Ichihara, Katsutarou ; Shimanuki, S. ; Yasuda, Nobuaki
Author_Institution :
Toshiba Corporation, Kawasaki, Kanagawa, Japan
Volume :
22
Issue :
5
fYear :
1986
fDate :
9/1/1986 12:00:00 AM
Firstpage :
1331
Lastpage :
1334
Abstract :
A large perpendicular magnetic anisotropy constant (Ku) has been achieved for the TbCo film by introducing a sputter-etching treatment on the dielectric underlayer film before the deposition of the TbCo film. The Kuvalue exceeded 2 × 106erg/cm3by sputter-etching treatment at power densities of 70 mW/cm2or greater. It has also been clarified that sputter-etching treatment contributed to achieving high stability of multilayer media life. The effects of the treatment process are described experimentally.
Keywords :
Magnetooptic memories; Perpendicular magnetic anisotropy; Dielectric films; Dielectric substrates; Geometrical optics; Magnetic films; Magnetic properties; Nonhomogeneous media; Optical films; Protection; Saturation magnetization; Semiconductor films;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1986.1064467
Filename :
1064467
Link To Document :
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