• DocumentCode
    1018182
  • Title

    Fabrication of a rugged, low-peak current high-speed tunnel diode

  • Author

    Im, S.S. ; Logan, Jeremy S.

  • Author_Institution
    International Business Machines Corporation, Poughkeepsie, N. Y.
  • Volume
    9
  • Issue
    1
  • fYear
    1962
  • Firstpage
    114
  • Lastpage
    114
  • Keywords
    Capacitance; Circuit noise; Electromagnetic scattering; Fabrication; Geometry; Glass; Hermetic seals; Laboratories; Packaging; Phonons; Photonic crystals; Semiconductor device noise; Semiconductor diodes; Semiconductor materials; Silicon; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2430
  • Type

    jour

  • DOI
    10.1109/T-ED.1962.14930
  • Filename
    1473158