Title :
Fabrication of a rugged, low-peak current high-speed tunnel diode
Author :
Im, S.S. ; Logan, Jeremy S.
Author_Institution :
International Business Machines Corporation, Poughkeepsie, N. Y.
Keywords :
Capacitance; Circuit noise; Electromagnetic scattering; Fabrication; Geometry; Glass; Hermetic seals; Laboratories; Packaging; Phonons; Photonic crystals; Semiconductor device noise; Semiconductor diodes; Semiconductor materials; Silicon; Temperature;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.14930
