• DocumentCode
    1018519
  • Title

    Delayed shielding of a test charge due to dynamical grain charging in a dusty plasma

  • Author

    Shafiq, Muhammad ; Raadu, Michael Allan

  • Author_Institution
    Div. of Plasma Phys., R. Inst. of Technol., Stockholm, Sweden
  • Volume
    32
  • Issue
    2
  • fYear
    2004
  • fDate
    4/1/2004 12:00:00 AM
  • Firstpage
    627
  • Lastpage
    631
  • Abstract
    The dynamical charging of grains in a dusty plasma modifies the plasma dielectric response function and the nature of the electrostatic wave modes. The grain charging leads to an additional shielding effect that acts in the same way as Debye shielding. Both the additional shielding and the charging rate are important in determining the response of a dusty plasma to a moving test charge. The dynamics of the charging can be approximated by using a time delay. An alternative analysis of the potential of a slowly moving test charge is performed introducing a delay operator for the grain charge response. The terms in the potential that depend on the charging dynamics involve a spatial shift given by the test charge velocity and the charging time. This gives a physical interpretation of earlier results which are identical to first order in the test charge velocity.
  • Keywords
    dusty plasmas; plasma dielectric properties; plasma electrostatic waves; Debye shielding; additional shielding effect; charging dynamics; charging rate; charging time; delay operator; delayed shielding; dusty plasma; dynamical grain charging; electrostatic wave modes; grain charge response; moving test charge; plasma dielectric response function; spatial shift; test charge velocity; time delay; Delay effects; Dielectrics; Dusty plasma; Electrons; Electrostatics; Performance analysis; Plasma temperature; Plasma waves; Projectiles; Testing; Complex plasmas; dusty plasmas; dynamical grain charging; test charge response;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2004.828451
  • Filename
    1308527