DocumentCode
1018519
Title
Delayed shielding of a test charge due to dynamical grain charging in a dusty plasma
Author
Shafiq, Muhammad ; Raadu, Michael Allan
Author_Institution
Div. of Plasma Phys., R. Inst. of Technol., Stockholm, Sweden
Volume
32
Issue
2
fYear
2004
fDate
4/1/2004 12:00:00 AM
Firstpage
627
Lastpage
631
Abstract
The dynamical charging of grains in a dusty plasma modifies the plasma dielectric response function and the nature of the electrostatic wave modes. The grain charging leads to an additional shielding effect that acts in the same way as Debye shielding. Both the additional shielding and the charging rate are important in determining the response of a dusty plasma to a moving test charge. The dynamics of the charging can be approximated by using a time delay. An alternative analysis of the potential of a slowly moving test charge is performed introducing a delay operator for the grain charge response. The terms in the potential that depend on the charging dynamics involve a spatial shift given by the test charge velocity and the charging time. This gives a physical interpretation of earlier results which are identical to first order in the test charge velocity.
Keywords
dusty plasmas; plasma dielectric properties; plasma electrostatic waves; Debye shielding; additional shielding effect; charging dynamics; charging rate; charging time; delay operator; delayed shielding; dusty plasma; dynamical grain charging; electrostatic wave modes; grain charge response; moving test charge; plasma dielectric response function; spatial shift; test charge velocity; time delay; Delay effects; Dielectrics; Dusty plasma; Electrons; Electrostatics; Performance analysis; Plasma temperature; Plasma waves; Projectiles; Testing; Complex plasmas; dusty plasmas; dynamical grain charging; test charge response;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2004.828451
Filename
1308527
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