DocumentCode :
1018528
Title :
High-frequency base-transport factor and transit time of graded-base transistors
Author :
Mayburg, S. ; Smith, B.
Author_Institution :
General Telephone and Electronics Labs., Inc., Bayside, N. Y.
Volume :
9
Issue :
2
fYear :
1962
fDate :
3/1/1962 12:00:00 AM
Firstpage :
161
Lastpage :
164
Abstract :
Closed expressions are derived for the modulus and argument, as well as for the real and imaginary parts of the complex base-transport factor (β) of diffusion and uniform drift-field transistors. Since these expressions involve only trigonometric, exponential, and hyperbolic functions, they are suitable for straightforward numerical computation as well as theoretical analysis. The variation of computed β-cutoff parameters as a function of impurity concentration is illustrated graphically and shown to be in good agreement with an approximate relation between the β-cutoff frequency and transit time due to Moll and Ross.
Keywords :
Bibliographies; Circuit theory; Counting circuits; Data analysis; Electron devices; Electrons; Frequency; Germanium; Impurities; Oscillators; Semiconductor diodes; Semiconductor impurities; Switches; Telephony; Transistors;
fLanguage :
English
Journal_Title :
Electron Devices, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2430
Type :
jour
DOI :
10.1109/T-ED.1962.14964
Filename :
1473192
Link To Document :
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