Title :
High-frequency base-transport factor and transit time of graded-base transistors
Author :
Mayburg, S. ; Smith, B.
Author_Institution :
General Telephone and Electronics Labs., Inc., Bayside, N. Y.
fDate :
3/1/1962 12:00:00 AM
Abstract :
Closed expressions are derived for the modulus and argument, as well as for the real and imaginary parts of the complex base-transport factor (β) of diffusion and uniform drift-field transistors. Since these expressions involve only trigonometric, exponential, and hyperbolic functions, they are suitable for straightforward numerical computation as well as theoretical analysis. The variation of computed β-cutoff parameters as a function of impurity concentration is illustrated graphically and shown to be in good agreement with an approximate relation between the β-cutoff frequency and transit time due to Moll and Ross.
Keywords :
Bibliographies; Circuit theory; Counting circuits; Data analysis; Electron devices; Electrons; Frequency; Germanium; Impurities; Oscillators; Semiconductor diodes; Semiconductor impurities; Switches; Telephony; Transistors;
Journal_Title :
Electron Devices, IRE Transactions on
DOI :
10.1109/T-ED.1962.14964