Title :
FCBM-a field-induced charged-board model for electrostatic discharges
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ
Abstract :
This work addresses a test method for the evaluation of electronic subassemblies against the threat of electrostatic discharges (ESD). It describes a field-induced charged board model (FCBM) for the simulation of real world ESD. An experiment is designed to observe and measure ESD current waveforms. An analytic theory is developed to describe important fundamental processes of the ESD phenomenon. The application of the theory to the FCBM ESD predicts waveform characteristics in excellent agreement with the experiment. A recommendation for the specification of the ESD waveform is offered for inclusion in future ESD test standards for electronic subassemblies
Keywords :
electrostatic discharge; printed circuit testing; ESD current waveforms; ESD test standards; electronic subassemblies; electrostatic discharges; field-induced charged-board model; Biological system modeling; Circuit testing; Contacts; Electronic equipment testing; Electrostatic discharge; Humans; Integrated circuit packaging; Integrated circuit reliability; Pins; Wiring;
Journal_Title :
Industry Applications, IEEE Transactions on