DocumentCode :
1018553
Title :
FCBM-a field-induced charged-board model for electrostatic discharges
Author :
Jin, D.L.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ
Volume :
29
Issue :
6
fYear :
1993
Firstpage :
1047
Lastpage :
1052
Abstract :
This work addresses a test method for the evaluation of electronic subassemblies against the threat of electrostatic discharges (ESD). It describes a field-induced charged board model (FCBM) for the simulation of real world ESD. An experiment is designed to observe and measure ESD current waveforms. An analytic theory is developed to describe important fundamental processes of the ESD phenomenon. The application of the theory to the FCBM ESD predicts waveform characteristics in excellent agreement with the experiment. A recommendation for the specification of the ESD waveform is offered for inclusion in future ESD test standards for electronic subassemblies
Keywords :
electrostatic discharge; printed circuit testing; ESD current waveforms; ESD test standards; electronic subassemblies; electrostatic discharges; field-induced charged-board model; Biological system modeling; Circuit testing; Contacts; Electronic equipment testing; Electrostatic discharge; Humans; Integrated circuit packaging; Integrated circuit reliability; Pins; Wiring;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.259711
Filename :
259711
Link To Document :
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